Assembly of the OIML Certification System Management Committee at the Swiss Federal Institute of Metrology (METAS) this past March 2023.
Could your measuring instrument manufacturing company benefit by having a significantly improved acceptance rate for your products in global markets? If yes, then obtaining a certification through the OIML Certification System (OIML-CS) may provide the critical evidence needed that your instrument type complies with the requirements of the relevant OIML Recommendation. As we continue to harmonize domestic and international requirements, test procedures, and type evaluation for measuring instruments, this will become increasingly important for all stakeholders both here in the US and abroad.
The International Organization of Legal Metrology held its eighth annual Certification System (OIML-CS) Management Committee meeting in March 2023. The meeting was hosted by the Swiss Federal Institute of Metrology (METAS) at its facilities in Bern, Switzerland. This meeting is especially noteworthy because it was the first time this key committee (or, in fact, any large OIML committee) has met “in-person” since 2019, due to pandemic issues and international travel restrictions. The OIML has operated a system for the international type evaluation of measuring instruments used in legal metrology since 1991. However, in January 2018 and after a three-year development period, a new and radically improved OIML Certification System (OIML-CS) was deployed with much better oversight and peer-review of all issuing authorities and test laboratories, as well as including more detailed written procedures that are applicable to many more instrument categories.
The US was represented by Mr. Ralph Richter (NIST OWM) and Mr. Darrell Flocken (NCWM/NTEP) at the meeting with excellent participation that included a diverse international representation overall. Several pressing issues for the Certification System were resolved across a wide range of technical areas. Thirty-seven (37) measuring instrument categories are currently covered under the OIML- ..
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