Doon Gibbs (Director, BNL), Jim Misewich (Associate Laboratory Director, Energy and Photon Sciences, BNL) Eric Lin (Director, Material Measurement Lab, NIST), Jim Olthoff (Associate Director for Laboratory Programs, NIST), Dan Fischer (Group Leader, Synchrotron Science Group, NIST), John Hill (Director, National Synchrotron Light Source II, BNL).
On November 6, 2019, NIST celebrated the opening of three new X-ray beamlines at the National Synchrotron Light Source II (NSLS-II) at Brookhaven National Laboratory (BNL), a Department of Energy (DOE) facility in Upton, New York. NIST’s suite of beamlines can be used to measure the electronic, chemical and structural properties of almost any material, often at the nanoscale, providing a route to answering key challenges in microelectronics, biology, energy and nanotechnology.
X-rays are a potent tool for measuring the composition and internal structure of materials. The more powerful the X-ray beam, the more types of materials you can examine, and the NSLS-II is designed to provide extremely bright X-rays. NIST’s new beamlines guide X-rays at three different energy levels, known as “hard” (4.5 keV to 23.6 keV), “tender” (about 2.0 keV to 7.5 keV) and “soft” (0.1 keV to 2.2 keV), for X-ray diffraction and three types of spectroscopy.
X-rays can reveal the relative location and amount of the elements within a given material because each element absorbs light at telltale energy levels. This level of structural detail has been used in the past to develop stronger glass for windshields and mobile electronic devices, for determining the electronic reactions that drive high performance batteries, and to study the structure of cancer-fighting therapeutics.
“With NIST staff stationed at BNL and working closely with our BNL and Department of Energy partners, NIST is strategically positioned to develop measure ..
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